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3430-SW     Dynamic Test System

The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
  
 
 

Features
・Low inductance structure reproduces an
  ideal waveforms.
・Test time is reduced drastically by high
  speed waveform analysis.
 

 Switching Time Test
I-Short Test
trr Test
VCE
30~1,500 V(1V Step)
30~1,500 V(1V Step)30~1,500 V(1V Step)
IC
1~300 A(1A Step) 
1~1,000 A(1A Step)1~300 A(1A Step)
IC Trip
1~300 A(1A Step) 
- 
1~300 A(1A Step)
IC max
1~1,000 A(1A Step) 
1~1,000 A(1A Step)1~1,000 A(1A Step)
VGE
±30.0 V(0.1V Step)±30.0 V(0.1V Step)±30.0 V(0.1V Step)
RG
1~250Ω(1Ω Step) 
1~250Ω(1Ω Step)1~250Ω(1Ω Step)
Pulse
Single/Double 
SingleDouble
T1
000.1μ~50.0 ms(0.1μs Step)000.1~50.0μs(0.1μs Step)000.1μ~50.0 ms(0.1μs Step)
T2
000.1~999.9μs(0.1μs Step)000.1~999.9μs(0.1μs Step)
T3
000.1~999.9μs(0.1μs Step) 
000.1~999.9μs(0.1μs Step)
R Load
Plug in 
L Load
Plug inPlug in
Pre checkGS Short/Open/Short/LeakGS Short/Open/Short/LeakVdsf(D.U.T)/ GS Short /Open/Short/Leak(Dummy)
Post check 
LeakLeak 
Leak(Dummy) 
Test Itemtd(on)/td(off)/ton/toff/tr/tf/Eon/Eoff/IC0 SC
trr/ trr1/ trr2/ Irr/ Qrr/ Qrr1/ Qrr2/ IF/ dIF/dt/ dI(rec)M/dt 
Test Time 
230 ms
140 ms250 ms
DSOLT364(LeCroy) 
LT364(LeCroy)
 
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