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351-TT/P     341-TT/P     Discrete Device Test System

The 341-TT/P and 351-TT/P have a capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing. 
 
 
 
 
Feature
・2kV/50A Capability in Main Frame (351-TT/P)
・Parallel Test Capability
・Programmable Forcing Timing

■Test Method
・TBB : Test By Branch
・TBS : Test By Sort
・Parallel/Serial Test
・2 points Judgment


Software Options
Conversion software to CSV file format which
   can be used for data analysis on Excel
Wafer map display software
Lot process function (available for customizing)
Tester control function from an extended unit by RS232C
 

MODEL
351-TT/P341-TT/P
 Host CPU
Personal Computer
 Operating System
Microsoft(R) Windows(R)
 Test Mode
Serial/Parallel
 Data Display
4digits
 Test Stations
2x 4
 Max Voltage
2,000V
(*3000V/5000V Option) 
1,200V
(*3000V/5000V Option) 
 Max Current
50A
(*100A/200A/300A/600A/1,200A Option)
20A
(*50A/100A/200A/300A/600A/1,200A Option)
 Test Plan
500
 Sort Plan
250
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*For details, please refer to the standard specification sheets of each product.

 
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