The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.  

The system is intended for high volume device manufacturing test, allowing up to 96 devices to be tested in parallel, but may also be used for verification, validation, and device  engineering tasks.  

The ULTRA P is a revolutionary step forward in device handling, thermal, mechanical stimulus and electrical signal performance.   

ULTRA P	Feature	Details
Input / Output	JEDEC Tray	16 x Pick & Place Input / Output
Carrier	Size	136mm x 136mm x 5mm 5.35” x  5.35” x  0.20”
	Device Pockets	2 to 96
Thermal Chamber	Temp Range	-40°C to +125°C, standard   -55°C to +150°C, option
	Resolution	0.1°C
	Accuracy	±1°C
	Stability	±0.1°C
	Heat Source	Electric Coil, 5200 watts
	Cold Source	LN2, 20-40 PSI
	TEMP Control	PID Controller
	Temp Measure	User and Chamber Sensors
Rate Stimulus	Primary Axis	-360° to +360°
	Secondary Axis	0° to +90°
	Third Axis	0° to +90°
Constant Mode	Accuracy	±15 Arc Seconds (.005°)
	Repeatability	±5 Arc Seconds (.001°)
	Rate Range	.0005º/Sec² to 1000º/Sec²
	Rate Accuracy	±0.01% of programmed value
Sinusoidal	Acceleration	2,000º/Sec²
	Speed Range	10 to 500º / second
	Freq Range	1 to 20Hz
DUT IO	Number of Lines	400 standard, 50Ω 800 optional,  50Ω
	Bandwidth	1.5GHz