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4380-IH     Strip Test Handler

We, Tesec is now introducing the new strip frame testing handler model 4380 that is for ambient and hot temperature testing without singular the SOIC devices attachedin matrix format on the strip frame.The device positions(x y z θ) are compensated before testing by visual alignment function, so that high accuracy of the device positioning and probe-pin contactor pressure for all of the devices are maintained as firm for stable testing and high indexing.
  
 
 

■FEATURES
・High throughput
・High withstand load and high thrust table
・LOT control by barcode and 2-D code reader
・Easy device type exchange only by few special
　parts exchange and screen setting
・Auto-cleaning function unit is installed to
　clean the socket at any desired timing
・S2/S8 regulation compliance
・SEMI G85 compliance
 

Model
4380-IH
　Applicable device
SOIC Type
　Applicable strip size
Less than 250 x 70mm
　Applicable magazine size
W175～260.3mm、D40～80.3mm、H250～340mm
　Test station
Multi-parallel
　Contact method.
Pogo-pin or specified contactor
　Supply magazine capacity
2 pcs
　Stock magazine capacity
3 pcs
 
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